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Summary
Description |
Deutsch: Rastertunnelmikroskopische Aufnahme einer Graphit-Oberfläche, gemessen bei Umgebungsbedingungen (Raumtemperatur, Luft). Zu sehen sind diejenigen Oberflächenatome, die kein unmittelbares Nachbaratom in der nächst unteren Graphitschicht besitzen. Gemessen in Sektion Kristallographie, Dept. Geo/Umwelt, LMU München.
English: Scanning Tunneling Microscopy image of graphite, aquired under ambient conditions. Measured at the Dept. for Earth and Environmental Sciences, LMU and Centre for NanoScience (CeNS), Munich.
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Date |
13 July 2007 |
Source |
Own work |
Author |
Frank Trixler, Ludwig-Maximilians-Universität München (LMU); adapted from LMU/CeNS: Organic Semiconductor Group |
Permission ( Reusing this file) |
gemeinfrei (public domain)
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Licensing
Public domainPublic domainfalsefalse |
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This work has been released into the public domain by its author, I, Nanotrix. This applies worldwide. In some countries this may not be legally possible; if so: I, Nanotrix grants anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law.Public domainPublic domainfalsefalse
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